VEDA: a web-based virtual environment for dynamic atomic force microscopy.

Gaining insight into the physics of dynamic atomic force microscopy in complex environments using the VEDA simulator.

Dynamic atomic force microscopy (dAFM) continues to grow in popularity among scientists in many different fields, and research on new methods and operating modes continues to expand the resolution, capabilities, and types of samples that can be studied. But many promising increases in capability are accompanied by increases in complexity. Indeed, interpreting modern dAFM data can be challenging...

Effects of Fluid Environment Properties on the Nonlinear Vibrations of AFM Piezoelectric Microcantilevers

Nowadays, atomic-force microscopy plays a significant role in nanoscience and nanotechnology, and is widely used for direct measurement at atomic scale and scanning the sample surfaces. In tapping mode, the microcantilever of atomic-force microscope is excited at resonance frequency. Therefore, it is important to study its resonance. Moreover, atomic-force microscopes can be operated in fluid e...

Sensitivity Analysis of Frequency Response of Atomic Force Microscopy in Liquid Environment on Cantilever's Geometrical Parameters

In this paper, the non-linear dynamic response of rectangular atomic force microscopy in tapping mode is considered. The effect of cantilever’s geometrical parameters (e.g., cantilever length, width, thickness, tip length and the angle between the cantilever and the sample's surface in liquid environment has been studied by taking into account the interaction forces. Results indicate that the r...

Using a Virtual Reality Environment to Simulate the Pushing of Cylindrical Nanoparticles

With the rise in the use of AFM (Atomic Force Microscope), we have witnessed a growing use of atomic microscope based nanorobots in the precise displacement of various particles. There are certain limitations to the application of nanorobots in the moving of nanoparticles. One of the most important of these limitations is the lack of an appropriate image feedback concurrent with the displaci...

Microcantilever dynamics in liquid environment dynamic atomic force microscopy when using higher-order cantilever eigenmodes